SIMS School

SIMS School Topics

We are excited to have an excellent SIMS School and tutorial session on Sunday June 8th.


All conference attendees are able to attend! 

Peter Williams

Fundamentals of Ion Sputtering


Beth Ann Bell

GeoSIMS and Geochronology


John Cliff

Precision Isotope Ratio Measurements


Albert J. Fahey

Characterization of Glass and other Insulators


Marco Hopstaken

Depth Profiling in Electronics

Sebastiaan Van Nuffel

Machine Learning in SIMS


Melissa Passarelli

Tandem MS in SIMS

Alan Spool

Instruments, Ion Formation and Artifacts in ToF-SIMS Analysis

Tanguy Terlier

AFM-SIMS