SIMS School

SIMS School Topics

We are excited to have an excellent SIMS School and tutorial session on Sunday June 8th.

All conference attendees are able to attend!

Peter Williams

Fundamentals of Ion Sputtering

Beth Ann Bell

GeoSIMS and Geochronology

John Cliff

Precision Isotope Ratio Measurements

Albert J. Fahey

Characterization of Glass and other Insulators

Marco Hopstaken

Depth Profiling in Electronics

Sebastiaan Van Nuffel

Machine Learning in SIMS

Melissa Passarelli

Tandem MS in SIMS

Alan Spool

Instruments, Ion Formation and Artifacts in ToF-SIMS Analysis

Tanguy Terlier

AFM-SIMS

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