The North American SIMS Society

Welcome to the North American SIMS society webpage!  

Secondary ion mass spectrometry (SIMS) is an analytical surface science technique that provide chemical, spatial, and depth information.  SIMS has a rich history in the United States and Canada, and our society serves as a platform to unite and empower SIMS enthusiasts from academia, industry, and government institutions. Together, we strive to advance the application of SIMS by fostering innovative technology and methodology development. Our society is committed to creating an inclusive and collaborative environment where members can connect, exchange ideas, and embark on research collaborations that push the boundaries of SIMS. Through various initiatives, such as SIMS workshops, symposium lecture series, and SIMS school, we provide opportunities for learning, knowledge sharing, and skill development.  We are dedicated to representing the interests of the North American SIMS community on the international stage, strengthening our collective voice and influence.

We invite you to explore our webpage, access the resources and information available, and connect with fellow members who share your passion for SIMS. Together, let us forge new frontiers in surface science and make significant contributions to the field.  

 If you would like to join or have any comments or concerns, please contact us at: simsworkshop @rice.edu 

Disclaimer: The web site includes hyperlinks to external web sites. We do not accept any responsibility for their content. The published content on these pages, including text, photos, graphics, animations and videos, are subject to copyright laws and we are not responsible for the accuracy of the content.